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Fast Measurement of Complex Permittivity of Microwave Dielectric Materials Using Parallel Short-Circuit Plate Method

CAO Liangzu 1, CAO Daming 2

(1School of Mechanical and Electronic Engineering, Jingdezhen Ceramic Institute, Jingdezhen Jiangxi 333001,China; 2.Chien-Shiung Wu College, Southeast University, Nanjing Jiangsu 211100,China)

Abstract:In order to fast gain microwave dielectric properties of materials, the measurement method for complex permittivity has been developed. The resonant frequency and loaded Q value of a dielectric resonator using TE011 and TE013 modes was tested by parallel short-circuit plate method, the transcendental equation was solved by Matlab software, so the relative permittivity and dielectric loss of the materials were gained. The dielectric properties of four sorts of materials have been measured, and the results have indicated that the method is fast and simple.

Key words: microwave dielectric material; TE011 mode; complex permittivity; Matlab


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