CAO Liangzu ,GUO Tongjun
(School of Mechanical and Electronic Engineering, Jingdezhen Ceramic Institute, Jingdezhen Jiangxi 33403, China)
Abstract:A method for measuring the properties of TEM type dielectric resonators was described. Two high-Q capacitors were connected to the open end of a resonator, and the resonator was weakly coupled to a Network Analyzer through these capacitors. The transmission curve was measured by the Network Analyzer, the circuit frequency and the loaded Q value of the resonator could be read from the curve. The differences between the theoretical and measured values have been analyzed theoretically, the formula for calculating the resonant frequency and the unloaded Q value of the resonator were derived. The dielectric ceramic resonators were made of BaO-TiO2-Sm2O3 microwave dielectric material with the dielectric constant being 74. Compared with the reflection measurement, the calculated value is more accurate.
Keywords:dielectric ceramic resonator, resonant frequency, unloaded Q value